Applied Physics Lettersにて発表した論文”Estimation of the critical condition for expansion/contraction of single Shockley stacking faults in 4H-SiC PiN diodes (link: https://aip.scitation.org/doi/10.1063/1.5143690)”（著者: Akifumi Iijima, Tsunenobu Kimoto）がAPLの”Editor’s Pick”に選ばれました。