International Journals

K. Ito, H. Tanaka, M. Horita, J. Suda, and T. Kimoto,
“Free electron mobility limited by fixed charges and trapped electrons in 4H-SiC(1120) and (1100) MOSFETs annealed in NO,“
Jpn. J. Appl. Phys. 64, 010902 (2025).

Review Article

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International Presentations