2020

International Journals

N. Kanegami, Y. Nishi, and T. Kimoto,
“Unique resistive switching phenomena exhibiting both filament-type and interface-type switching in Ti/Pr0.7Ca0.3MnO3-δ/Pt ReRAM cells,”
Appl. Phys. Lett., 116, 013501 (2020).

M. Kaneko, K. Hirai, T. Kimoto, and J. Suda,
“Multi-cycle RHEED oscillation under nitrogen supply in alternative source supply AlN growth by rf-MBE,”
Appl. Phys. Express, 12, 025503 (2020).

A. Iijima and T. Kimoto,
“Estimation of the critical condition for expansion/contraction of single Shockley stacking faults in 4H-SiC PiN diodes,”
Appl. Phys. Lett., 116, 092105 (2020).

S. Asada, J. Suda, and T. Kimoto,
“Temperature Dependence of Conductivity Modulation in SiC Bipolar Junction Transistors,”
IEEE Tran. on Electron Devices, 67, pp. 1699-1704 (2020).

S. Yamashita and T. Kimoto,
“Analysis of carrier lifetimes in n-type 4H-SiC by rate equations,”
Appl. Phys. Express, 13, 011006 (2020).

M. Hara, S. Asada, T. Maeda, and T. Kimoto,
“Forward thermionic field emission transport and significant image force lowering caused by high electric field at metal/heavily-doped SiC Schottky interfaces,”
Appl. Phys. Express, 13, 041001 (2020).

H. Tanaka, T. Kimoto, and N. Mori,
“Theoretical analysis of band structure effects on impact ionization coefficients in wide-bandgap semiconductors,”
Appl. Phys. Express, 13, 041006 (2020).

H. Akita and T. Kimoto,
“Rapid revolution speed control of the brushless DC motor for Automotive LIDAR applications,”
IEICE Trans. Electron., E103-C, 324 (2020).

International Presentations

Y. Yonezawa, K. Nakayama, H. Tsuchida, T. Kimoto, and H. Okumura,
“Bipolar Forward Degradation Phenomena and Countermeasures in SiC Power Device” (invited),
ECPE Workshop on Power Semiconductor Robustness – What Kills Power Devices? (Munich, Germany, 2020), SC-2.

T. Kimoto and M. Kaneko,
“Progress and future challenges of SiC power devices for energy efficiency” (plenary),
12th Int. Symp. on Advanced Plasma Sci. & Its Applications for Nitrides and Nanomaterials (Nagoya, Japan, 2020).

T. Maeda, T. Narita, S. Yamada, T. Kachi, T. Kimoto, M. Horita, and J. Suda,
“Study on Avalanche Breakdown in GaN -Determination of Impact Ionization Coefficients and Critical Electric Field-,”
International Symposium on Creation of Advanced Photonic and Electronic Devices 2020 (Kyoto, Japan, 2020), P-31.

K. Kanegae, M. Horita, T. Kimoto, and J. Suda,
“Photoionization Cross Section of the Carbon-related Hole Trap in n-type GaN,”
International Symposium on Creation of Advanced Photonic and Electronic Devices 2020 (Kyoto, Japan, 2020), P-32.

K. Tachiki and T. Kimoto,
“Investigation of Gate Oxide Reliabilities in N2 Annealed SiC/SiO2 Structure,”
International Symposium on Creation of Advanced Photonic and Electronic Devices 2020 (Kyoto, Japan, 2020), P-33.

K. Ito, T. Kobayashi, and T. Kimoto,
“Interface State Density Distribution Considering the Inversion Layer Quantization in SiC MOSFETs,”
International Symposium on Creation of Advanced Photonic and Electronic Devices 2020 (Kyoto, Japan, 2020), P-34.

T. Miyatani, Y. Nishi, and T. Kimoto,
“Gradual Resistive Switching Characteristics in Pt/TaOx/Ta2O5/Pt Cells,”
International Symposium on Creation of Advanced Photonic and Electronic Devices 2020 (Kyoto, Japan, 2020), P-35.

M. Hara, S. Asada, T. Maeda, and T. Kimoto,
“Reverse Field Emission Current in Heavily-Doped SiC Schottky Barrier Diodes,”
International Symposium on Creation of Advanced Photonic and Electronic Devices 2020 (Kyoto, Japan, 2020), P-36.